Home / Services / knowledge / 2.Definition of Dimensional Properties,Terminology and Methods of Silicon Carbide Wafer /

2-11.Edge Chips

2.Definition of Dimensional Properties,Terminology and Methods of Silicon Carbide Wafer

2-11.Edge Chips

2018-01-08

Any edge anomalies (including wafer saw exit marks) in excess of 1.0 mm in either radial depth or width. As viewed under diffuse illumination, edge chips are determined as unintentionally missing material from the edge of the wafer.

Contact Us

If you would like a quotation or more information about our products, please leave us a message, will reply you as soon as possible.
   
Contact Us Contact Us 
If you would like a quotation or more information about our products, please leave us a message, will reply you as soon as possible.